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Materials Characterization

Category Materials Testing Lab
Test Materials Characterization
Description

At EMSL Analytical, a wide variety of materials — metals, polymers, ceramics, semiconductors, and many others — can be analyzed for their elemental composition, phases, structure, and properties.

Chemical Analysis
Information about the major or trace elemental components of a sample can be obtained using state-of-the-art WDXRF (wavelength-dispersive X-ray fluorescence), ICP (inductively-coupled plasma), and AA (atomic absorption) spectrometers. Chemical compounds can be identified by GC/MS (gas chromatograpy/mass spectrometry). Residual gas analysis is an on-going effort at EMSL Analytical that includes a novel approach of glow discharge visible and infrared spectrometry, and a conventional approach utilizing quadrupole mass spectrometers.


Structural Analysis
XRD (X-ray diffraction) is often used for qualitative and quantitative crystalline phase analysis at EMSL Analytical. Other techniques used for phase and structural analysis include NIR (near-infrared) and FTIR (Fourier transform infrared) spectroscopy; thin film analysis by XRD; and electron diffraction with TEM (transmission electron microscopy). Our µ-FTIR is capable of obtaining an infrared absorption spectrum from a region as small as 15µm, which makes identification of small unknown particles a much easier task.

XRD spectrum of an alloy sample
Microscopy Analysis
OM (optical microscopy), SEM (scanning electron microscopy) and TEM (transmission electron microscopy) are used at EMSL Analytical for various types of microstructural analysis and phase identification. For example, particles can be identified first with PLM (polarized light microscopy) and then further verified by SEM/EDX (energy-dispersive X-ray analysis); the grain- and microstructure of alloys can be determined with TEM; the defects in semiconductors can be checked by cross-section TEM analysis; the quality of wire-bonding can be examined by SEM inspection; and the thickness of a thin film deposition can be characterized using a scanning AES (Auger electron spectrometer) to generate a depth profile.

Ann Arbor, MI (LAB 08) - NVLAP Lab Code 101048-4Atlanta, GA (LAB 07) - NVLAP Lab Code 101048-1Baton Rouge, LA (LAB 25) - NVLAP Lab Code 200375-0Beltsville, MD (LAB 19) - NVLAP Lab Code 200293-0Boston, MA (LAB 13) - NVLAP Lab Code 101147-0Buffalo, NY (LAB 14) - NVLAP Lab Code 200056-0Carle Place, NY (LAB 06) - NVLAP Lab Code 101048-10Charlotte, NC (LAB 41) - NVLAP Lab Code 200841-0Chicago, IL (LAB 26) - NVLAP Lab Code 200399-0Cinnaminson, NJ (LAB List in Description) - NVLAP Lab Code 101048-0Dallas, TX (LAB 11) - NVLAP Lab Code 600111-0Denver, CO (LAB 22) - NVLAP Lab Code 200828-0EMSL Canada - Calgary, AB (LAB 65) - NVLAP Lab Code 500100-0EMSL Canada - Montreal, QC (LAB 68) - NVLAP Lab Code 201052-0EMSL Canada - Ottawa, ON (LAB 67) - NVLAP Lab Code 201040-0EMSL Canada - Toronto, ON (LAB 55) - NVLAP Lab Code 200877-0EMSL Canada - Vancouver, BC (LAB 69) - NVLAP Lab Code 201068-0Fort Lauderdale, FL (LAB 56) - NVLAP Lab Code 500085-0Houston, TX (LAB 15) - NVLAP Lab Code 102106-0Huntington Beach, CA (LAB 33) - NVLAP Lab Code 101384-0Indianapolis, IN (LAB 16) - NVLAP Lab Code 200188-0Inland Empire, CA (LAB 71) - NVLAP Lab Code 600239-0Jacksonville, FL (LAB 54) - NVLAP Lab Code 600265-0Kernersville, NC (LAB 02) - NVLAP Lab Code 102104-0Las Vegas, NV (LAB 31) - NVLAP Lab Code 600140-0Miami, FL (LAB 17) - NVLAP Lab Code 200204-0Minneapolis, MN (LAB 35) - NVLAP Lab Code 200019-0New York, NY (LAB 03) - NVLAP Lab Code 101048-9Orlando, FL (LAB 34) - NVLAP Lab Code 101151-0Phoenix, AZ (LAB 12) - NVLAP Lab Code 200811-0Piscataway, NJ (LAB 05) - NVLAP Lab Code 101048-2Plymouth Meeting, PA (LAB 18) - NVLAP Lab Code 200699-0Raleigh, NC (LAB 29) - NVLAP Lab Code 200671-0Rochester, NY (LAB 53) - NVLAP Lab Code 600183-0Salem, NH (LAB 23) - NVLAP Lab Code 201051-0San Diego, CA (LAB 43) - NVLAP Lab Code 200855-0San Leandro, CA (LAB 09) - NVLAP Lab Code 101048-3Seattle, WA (LAB 51) - NVLAP Lab Code 200613-0South Pasadena, CA (LAB 32) - NVLAP Lab Code 200232-0South Portland, ME (LAB 62) - NVLAP Lab Code 500094-0St. Louis, MO (LAB 39) - NVLAP Lab Code 200742-0Tampa, FL (LAB 93) - NVLAP Lab Code 600215-0Wallingford, CT (LAB 24) - NVLAP Lab Code 200700-0West Palm Beach, FL (LAB 57) - NVLAP Lab Code 600206-0Weymouth, MA (LAB 64) - NVLAP Lab Code 600217-0
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